Titel
Scanning electron microscopy and X-ray microanalysis
Beschreibung
Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein ... [et al.]
Physische Beschreibung
XIX, 690 p., [3] c. di tav. : ill. ; 26 cm + 1 CD-ROM.
Standardzahlen
ISBN: 0306472929
ISBN: 9780306472923
ISBN: 9781461349693, Rist. softcover senza CD-ROM
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