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EXAFS spectroscopy : techniques and applications

Symposium on the applications of EXAFS to Materials Science <1979 : Boston>

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Titel

EXAFS spectroscopy : techniques and applications

Namen

[Curatore] Joy, David C.
[Curatore] Teo, Boon-Keng
[Organizzatore di meeting] Symposium on the applications of EXAFS to Materials Science <1979 : Boston>
Materials research society

Beschreibung

EXAFS spectroscopy : techniques and applications / edited by B. K. Teo and D. C. Joy

Physische Beschreibung

VIII, 275 p. : ill. ; 25 cm

Notiz

Based on the proceedings of a symposium on the applications of EXAFS to materials science, held at the 1979 meeting of the Material Research Society, November 26-30, 1979, in Boston, Massachusetts

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ISBN: 0306406543

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New York

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STATI UNITI

Zunge

INGLESE

Ein anderer Titel

Extended X-ray absorption fine structure spectroscopy : techniques and applications

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Biblioteche SBN Sardegna

IT\ICCU\RMS\0003553

Ressourcenverbindungen

http://id.sbn.it/bid/RMS0003553

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Texte

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EXAFS spectroscopy : techniques and applications

Etikett

Presentation of donkey to Heckscher Farm Stamford Museum and Nature Center : Stamfort, Connecticut

Presentation of donkey to Heckscher Farm Stamford Museum and Nature Center : Stamfort, Connecticut

Electron microscopy and structure of materials : proceedings of the Fifth international materials symposium "The structure and properties of materials. Techniques and applications of electron microscopy", held at the University of California, Berkeley, September 13-17, 1971

Surface phenomena : proceedings of the second symposium on fundamental phenomena in the materials science, held January 27-28, 1964, at Boston, Mass.

Symposium on love: the devastating little breath of eros

Mediaeval researches from eastern asiatic sources : fragments towards the knowledge of the geography and history of Central and Western Asia from the 13. to the 17. century

Arthur Fiedler and the Boston Pops play the Beatles

The leap : the science of trust and why it matters

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