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Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Topical Conference on Characterization Techniques for semiconductor materials and devices

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Testo

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Titre

Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Des noms

Barnes, Peter A.
Rozgonyi, George A.
[Autore] Topical Conference on Characterization Techniques for semiconductor materials and devices

Description

Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Description physique

XI, 532 p. : ill. ; 23 cm.

Date

1978

Place de publication

Princenton, N.J.

Village

STATI UNITI

Langue

INGLESE

Source

Biblioteche SBN Sardegna

IT\ICCU\CAG\1837871

Liens de ressources

http://id.sbn.it/bid/CAG1837871

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Semiconductor characterization techniques : proceedings of the topical conference on characterization techniques for semiconductor materials and devices

Étiqueter

Hiroshima and Nagasaki : the politics of human powerlessness

Hiroshima and Nagasaki : the politics of human powerlessness

Characterization of semiconductor materials

1: Powders, characterization, testing, and quality control

Buffalo on the Roof : a celebration of Yiddish/Klezmer and other Eastern European music, dance & folklore

Le sable, l'eau et l'humus : techniques traditionnelles ete ressources alimentaires aux Tuamotu

Arrangements and fantasias on the Themes of the Ring by Richard Wagner : for symphonic band

Variations and fugue on a theme of Purcell

commentaires